The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2019
Filed:
Apr. 12, 2017
Jenoptik Industrial Metrology Germany Gmbh, Villingen-Schwenningen, DE;
Raimund Volk, Villingen-Schwenningen, DE;
JENOPTIK Industrial Metrology Germany GmbH, Villingen-Schwenningen, DE;
Abstract
A measuring assembly for measuring the contour of a workpiece has a measuring probe that is pivotably supported and deflectable about a first axis (measuring axis) in order to contact a surface of the workpiece, and has a second axis that is associated with the workpiece. The first axis and the second axis are parallel or approximately parallel to one another for radially contacting a surface of the workpiece. A device for rotating the measuring probe and the workpiece relative to one another is provided, such that the measuring probe contacts the surface of the workpiece during the rotation, and a device for plotting the angular deflection of the measuring probe as a function of the particular rotational position of the workpiece relative to the measuring probe is provided.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile