The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

Mar. 08, 2017
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventor:

Yuhei Umeda, Kawasaki, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F02D 41/24 (2006.01); F02D 41/26 (2006.01); F02D 41/14 (2006.01);
U.S. Cl.
CPC ...
F02D 41/263 (2013.01); F02D 41/1401 (2013.01); F02D 41/2419 (2013.01); F02D 41/2432 (2013.01); F02D 41/2445 (2013.01); F02D 41/2467 (2013.01); F02D 2041/1433 (2013.01);
Abstract

A non-transitory computer-readable recording medium stores a data-acquisition-instruction generating program that causes a computer to execute a process including: first generating a plurality of change curves of each of control parameters based on requisite density information, the requisite density information being related to a data measurement density in a data measurement region specified by a combination of a plurality of control parameters, the plurality of control parameters being used by a device subject to the data measurement; and second generating a data acquisition instruction to perform measurement at a plurality of measurement points with respect to the device to be measured in an order in which change of each control parameter becomes change corresponding to the change curves, and new measurement is performed such that only one of the control parameters changes from previous measurement.


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