The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

Feb. 22, 2019
Applicant:

Exoanalytic Solutions, Inc., Mission Viejo, CA (US);

Inventors:

Douglas Lee Hendrix, Ladera Ranch, CA (US);

William Alexander Therien, Upland, CA (US);

Assignee:

ExoAnalytic Solutions, Inc., Mission Viejo, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B64G 3/00 (2006.01);
U.S. Cl.
CPC ...
B64G 3/00 (2013.01);
Abstract

The system may be configured to receive a selection of a plurality of timepoints corresponding to an orbital object. The selection of the plurality of timepoints can include sets of identifiers within the selected time period. The system may further be configured to determine an orbital path of the orbital object associated with the selected plurality of timepoints. The orbital path may be determined over an orbital time period that includes a first time period that (i) overlaps the selected time period, (ii) precedes the selected time period, (iii) succeeds the selected time period, or (iv) any combination thereof. The system may generate a display interface that includes a longitude-time graph having a longitude axis spanning from a lower-longitude limit to an upper-longitude limit, a time axis spanning from the lower-time limit to the upper-time limit, and an indication of the orbital path spanning at least the first time period.


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