The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2019
Filed:
Aug. 04, 2017
Applicant:
National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);
Inventors:
Christopher Phaneuf, Livermore, CA (US);
Chung-Yan Koh, Dublin, CA (US);
Assignee:
National Technology & Engineering Solutions of Sandia, LLC, Albuquerque, NM (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); G01N 21/64 (2006.01); B01J 19/00 (2006.01); B01L 3/00 (2006.01); B01L 7/00 (2006.01); C12Q 1/6844 (2018.01); C12Q 1/68 (2018.01); G01N 15/04 (2006.01); C12Q 1/6848 (2018.01); G01N 27/447 (2006.01); G01N 15/14 (2006.01); G01N 21/359 (2014.01);
U.S. Cl.
CPC ...
B01L 7/52 (2013.01); B01L 3/50273 (2013.01); C12Q 1/6846 (2013.01); G01N 21/35 (2013.01); G01N 21/64 (2013.01); B01J 2219/0097 (2013.01); B01L 2300/0627 (2013.01); B01L 2300/0803 (2013.01); B01L 2300/168 (2013.01); B01L 2300/1861 (2013.01); B01L 2300/1872 (2013.01); B01L 2400/0409 (2013.01); C12Q 1/6848 (2013.01); G01N 15/1484 (2013.01); G01N 21/359 (2013.01); G01N 21/6428 (2013.01); G01N 27/44791 (2013.01); G01N 27/44795 (2013.01); G01N 2015/045 (2013.01);
Abstract
The present invention relates to a temperature control system for a microfluidic device. The system allows for non-contact heating by employing an infrared emitter. In some instances, the system can be used in conjunction with a centrifugal microfluidic device. Optionally, a mask can be implemented to provide selective heating of desired assay areas of the device.