The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

Aug. 31, 2017
Applicant:

Novartis Ag, Basel, CH;

Inventors:

Johan Ekvall, Laguna Beach, CA (US);

Paul J. Essex, Rancho Santa Margarita, CA (US);

Kirk Todd, Yorba Linda, CA (US);

Assignee:

Novartis AG, Basel, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61F 9/007 (2006.01); A61M 1/00 (2006.01); G01L 11/02 (2006.01); A61F 9/008 (2006.01); G01L 9/00 (2006.01); A61B 34/00 (2016.01);
U.S. Cl.
CPC ...
A61F 9/008 (2013.01); A61B 34/25 (2016.02); A61M 1/0025 (2014.02); G01L 9/0077 (2013.01); A61B 2562/0247 (2013.01); A61F 2009/00844 (2013.01); A61M 2205/12 (2013.01); A61M 2205/3306 (2013.01); A61M 2205/3331 (2013.01); A61M 2210/0612 (2013.01);
Abstract

A method and system provide a surgical system including a cassette, a console and an interferometric pressure sensing system coupled with the console. The cassette is for exchanging material with a patient and includes a wall and a reflector. The wall undergoes a deflection in response to a nonambient internal cassette pressure. The console is coupled with the cassette. The interferometric pressure sensing system is coupled with the console. The interferometric pressure sensing system includes a light source and a detector. The light source provides a first portion of light that is reflected off of the reflector and a second portion of light that bypasses the reflector. The first portion and the second portion of light are recombined to form an interference pattern. The deflection corresponds to a shift in the interference pattern detectable by the detector.


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