The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2019
Filed:
Nov. 19, 2015
International Business Machines Corporation, Armonk, NY (US);
Jae-Lyn Hecht, Boston, MA (US);
Fang Lu, Billerica, MA (US);
Azadeh Salehi, Pepperell, MA (US);
Olga M. Sanchez Sanchez, Littleton, MA (US);
Zi C. Sardone, Chelmsford, MA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Embodiments of the present invention provide systems and methods for performing analysis validity ranking of information. The method utilizes technology such as MRI, CT, PET, SPECT, EEG, and MEG to collect a user's cognitive event, to analyze the user's cognitive event via analytics, and to correlate the user's cognitive event with a ranking. This correlated data is sent to a database amenable to future inquiries on cognitive events of the user. The search results are based on the level of validity for retrieving accurate search results from the database at a future point in time. A validity and the rank of the data deriving from the user's cognitive event are evaluated based on the brainwaves and the location of the data deriving from the user's cognitive event. The data with a higher validity is ranked higher and tagged accordingly.