The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2019
Filed:
Nov. 05, 2015
Safran Electronics & Defense Sas, Boulogne Billancourt, FR;
Dominique Maltese, Boulogne Billancourt, FR;
Mathieu Oudinot, Boulogne Billancourt, FR;
Quentin Perdriau, Boulogne Billancourt, FR;
Thomas Devichi, Boulogne Billancourt, FR;
SAFRAN ELECTRONICS & DEFENSE SAS, Boulogne Billancourt, FR;
Abstract
A defective-pixel detection method included in an image-processing procedure, including a pixel-processing procedure applied to pixels of an image supplied by an image sensor. Each pixel is associated with a classification value representing a state of said pixel. The method includes, for each pixel: applying the pixel-processing procedure; analyzing a result of the pixel-processing procedure; in the event of obtaining an unusual result representing a defect on a photosite of the image sensor that supplied said pixel, incrementing a number of detections of an unusual result for said pixel; and associating said pixel with a classification value representing a defective pixel when said number reaches a first threshold.