The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2019
Filed:
Oct. 19, 2015
Applicant:
Adobe Inc., San Jose, CA (US);
Inventors:
Shiv Kumar Saini, Rajasthan, IN;
Ritwik Sinha, Kolkata, IN;
Michael Rimer, Saratoga Springs, UT (US);
Anandhavelu N, Tamil Nadu, IN;
Assignee:
Adobe Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04L 29/08 (2006.01); G06Q 30/02 (2012.01); G06F 11/34 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 67/025 (2013.01); G06F 11/3409 (2013.01); G06Q 30/0201 (2013.01); H04L 67/22 (2013.01); H04L 41/142 (2013.01); H04L 43/08 (2013.01); H04L 67/02 (2013.01);
Abstract
The present disclosure is directed toward systems and methods for identifying contributing factors associated with a multi-variable metric anomaly. One or more embodiments described herein identify one or more contributing factors that led to an anomaly in a multi-variable metric by calculating linearizing weights such that the total deviation in the multi-variable metric can be written as a weighted sum of deviations for dimension elements associated with the multi-variable metric.