The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Dec. 13, 2017
Applicant:

Lightbend, Inc., San Francisco, CA (US);

Inventors:

Omer Emre Velipasaoglu, San Francisco, CA (US);

Arun Kejariwal, Fremont, CA (US);

Alan Honkwan Ngai, Santa Clara, CA (US);

Craig David Upson, Berkeley, CA (US);

Uday K. Chettiar, Mountain View, CA (US);

Assignee:

Lightbend, Inc., San Francisco, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); H04L 12/24 (2006.01); H04L 12/26 (2006.01); H04L 5/00 (2006.01);
U.S. Cl.
CPC ...
H04L 41/0609 (2013.01); H04L 5/0058 (2013.01); H04L 41/0654 (2013.01); H04L 41/0681 (2013.01); H04L 41/22 (2013.01); H04L 43/067 (2013.01);
Abstract

The technology disclosed relates to differential analysis of sets of time series pairs. In particular, it relates to building estimators of magnitude of difference between two time series. After the basic estimators are built, they are combined into ensemble estimators using linear or nonlinear prediction models to improve their accuracy. In one application, the ensemble is used for estimating the magnitudes of difference over sets of metric pairs observed from distributed applications and systems running over a computer network. The metric pairs are then ranked in decreasing order of magnitude of difference to guide an operator in prioritizing his root cause analysis of faults, thereby reducing the time-to-resolution of problems.


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