The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Feb. 01, 2019
Applicant:

Alexei V. Nikitin, Wamego, KS (US);

Inventor:

Alexei V. Nikitin, Wamego, KS (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/06 (2006.01); H03M 3/00 (2006.01); H03H 7/12 (2006.01); H03H 21/00 (2006.01);
U.S. Cl.
CPC ...
H03M 3/368 (2013.01); H03H 7/12 (2013.01); H03H 21/0001 (2013.01); H03H 21/0016 (2013.01); H03M 3/422 (2013.01); H03M 3/438 (2013.01); H03M 3/458 (2013.01);
Abstract

Method and apparatus for nonlinear signal processing include mitigation of outlier noise in the process of analog-to-digital conversion and adaptive real-time signal conditioning, processing, analysis, quantification, comparison, and control. Methods, processes and apparatus for real-time measuring and analysis of variables include statistical analysis and generic measurement systems and processes which are not specially adapted for any specific variables, or to one particular environment. Methods and corresponding apparatus for mitigation of electromagnetic interference, for improving properties of electronic devices, and for improving and/or enabling coexistence of a plurality of electronic devices include post-processing analysis of measured variables and post-processing statistical analysis.


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