The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Jun. 02, 2016
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Masaya Nagata, Kanagawa, JP;

Kaori Takimoto, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/14 (2006.01); H01L 23/28 (2006.01); H01L 23/29 (2006.01); H01L 23/31 (2006.01); H01L 25/07 (2006.01); H01L 25/18 (2006.01); H01L 25/04 (2014.01); H01L 25/11 (2006.01); H01L 27/146 (2006.01); H01L 25/065 (2006.01); H01L 21/56 (2006.01); H01L 23/00 (2006.01); H01L 25/075 (2006.01); H01L 21/768 (2006.01); H01L 21/78 (2006.01);
U.S. Cl.
CPC ...
H01L 27/14634 (2013.01); H01L 21/563 (2013.01); H01L 23/28 (2013.01); H01L 23/29 (2013.01); H01L 23/31 (2013.01); H01L 23/3114 (2013.01); H01L 23/3142 (2013.01); H01L 24/05 (2013.01); H01L 24/32 (2013.01); H01L 25/065 (2013.01); H01L 25/07 (2013.01); H01L 25/18 (2013.01); H01L 27/14 (2013.01); H01L 27/1469 (2013.01); H01L 27/14618 (2013.01); H01L 27/14636 (2013.01); H01L 21/76898 (2013.01); H01L 21/78 (2013.01); H01L 24/11 (2013.01); H01L 24/16 (2013.01); H01L 24/73 (2013.01); H01L 24/81 (2013.01); H01L 24/83 (2013.01); H01L 24/92 (2013.01); H01L 24/94 (2013.01); H01L 25/043 (2013.01); H01L 25/0657 (2013.01); H01L 25/074 (2013.01); H01L 25/0756 (2013.01); H01L 25/117 (2013.01); H01L 27/14632 (2013.01); H01L 27/14643 (2013.01); H01L 27/14687 (2013.01); H01L 2224/05025 (2013.01); H01L 2224/131 (2013.01); H01L 2224/16225 (2013.01); H01L 2224/16227 (2013.01); H01L 2224/32145 (2013.01); H01L 2224/32225 (2013.01); H01L 2224/33181 (2013.01); H01L 2224/73204 (2013.01); H01L 2224/73253 (2013.01); H01L 2224/81815 (2013.01); H01L 2224/92225 (2013.01); H01L 2224/92242 (2013.01); H01L 2224/94 (2013.01); H01L 2924/35121 (2013.01);
Abstract

The present disclosure relates to a semiconductor device, an electronic device, and a manufacturing method that can maintain the mounting reliability of an underfill. A chip is formed by a circuit of an imaging element being produced on a Si substrate that is a first substrate and a second substrate being produced on an adhesive formed on the circuit. In this event, a photosensitive material is formed around the chip after the chip is mounted on a mounting substrate by a solder ball or in the state of the chip, then an underfill is formed, and then only the photosensitive material is dissolved. The present disclosure can be applied to, for example, a CMOS solid-state imaging sensor used for an imaging device such as a camera.


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