The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Dec. 21, 2017
Applicant:

Buffalo Inc., Nagoya-shi, JP;

Inventors:

Yu Nakase, Nagoya, JP;

Takayuki Okinaga, Nagoya, JP;

Shuichiro Azuma, Nagoya, JP;

Kazuki Makuni, Nagoya, JP;

Takeshi Kotegawa, Nagoya, JP;

Noriaki Sugahara, Nagoya, JP;

Assignee:

BUFFALO INC., Nagoya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 25/065 (2006.01); H01L 23/00 (2006.01); H01L 23/538 (2006.01); H01L 25/00 (2006.01);
U.S. Cl.
CPC ...
H01L 25/0657 (2013.01); H01L 23/5386 (2013.01); H01L 24/06 (2013.01); H01L 24/49 (2013.01); H01L 25/0652 (2013.01); H01L 25/50 (2013.01); H01L 24/05 (2013.01); H01L 24/48 (2013.01); H01L 2224/04042 (2013.01); H01L 2224/05554 (2013.01); H01L 2224/0612 (2013.01); H01L 2224/32145 (2013.01); H01L 2224/48091 (2013.01); H01L 2224/48145 (2013.01); H01L 2224/48147 (2013.01); H01L 2224/48227 (2013.01); H01L 2224/49175 (2013.01); H01L 2224/73265 (2013.01); H01L 2225/0651 (2013.01); H01L 2225/06506 (2013.01); H01L 2225/06562 (2013.01); H01L 2924/00014 (2013.01); H01L 2924/1436 (2013.01); H01L 2924/1438 (2013.01); H01L 2924/15162 (2013.01); H01L 2924/15311 (2013.01); H01L 2924/15323 (2013.01); H01L 2924/19041 (2013.01); H01L 2924/19105 (2013.01); H01L 2924/30107 (2013.01);
Abstract

A semiconductor device comprising a plurality of semiconductor chips and a plurality of electric wirings. The plurality of semiconductor chips are stacked in a first direction, each semiconductor chip of the plurality of semiconductor chips including a plurality of conductive pads that are aligned in an aligning direction, orthogonal to the first direction. The plurality of semiconductor chips are stacked such that each semiconductor chip is shifted from an adjacent semiconductor chip of the plurality of semiconductor chips by a first predetermined interval in the aligning direction and shifted from the adjacent semiconductor chip by a second predetermined interval in a second direction orthogonal to both the first direction and the aligning direction. The plurality of electric wirings electrically connect the plurality of conductive pads of every other semiconductor chip of the plurality of semiconductor chips, respectively.


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