The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Dec. 07, 2015
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Tan Yan, Bedminster, NJ (US);

Guofei Jiang, Princeton, NJ (US);

Haifeng Chen, Old Bridge, NJ (US);

Kai Zhang, Monmouth Junction, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 99/00 (2011.01); G07C 3/00 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G07C 3/00 (2013.01); G05B 23/0232 (2013.01); G05B 23/0283 (2013.01);
Abstract

Systems and methods for managing components of physical systems, including decomposing raw time series by extracting an aging trend and a fluctuation term from the time series using an objective function of an optimization problem, the objective function minimizing reconstruction error and ensuring flatness of the fluctuation term over time. The optimization problem is transformed into a Quadratic Programming (QP) formulation including a monotonicity constraint and a non-negativity constraint, the constraints being merged together to reduce computational costs. An aging score and a confidence score are generated for the extracted aging trend to determine a severeness of aging for one or more components of the physical system, and the aging score and confidence score are fused to provide a fused ranking for the extracted aging trend for predicting future failures of the components.


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