The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2019
Filed:
May. 04, 2017
Takahiro Fukase, Kanagawa, JP;
Takahiro Fukase, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An inspection apparatus, system, and method, each of which: acquires a master image serving as an inspection reference, the master image being generated based on image data to be printed as a printed image; acquires a read image read from the printed image; extracts a neighboring region neighboring an edge region of the master image; determines whether a change amount of density of pixels in the neighboring region falls within a predetermined range; based on a determination that the change amount of density of pixels in the neighboring region falls within the predetermined range, calculates a statistic of density of pixels in a corresponding region of the read image, which corresponds to the neighboring region of the master image; and determines existence or non-existence of a defect in the corresponding region of the read image based on the statistic of the corresponding region.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile