The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Mar. 03, 2015
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Yusuke Muraoka, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2006.01); G06F 16/2458 (2019.01); G06Q 10/04 (2012.01); G06F 16/22 (2019.01);
U.S. Cl.
CPC ...
G06N 5/048 (2013.01); G06F 16/22 (2019.01); G06F 16/2465 (2019.01); G06Q 10/04 (2013.01);
Abstract

Facilitate the procedure of evaluating a predictor. This evaluation system comprises an input receiving unit via which elements constituting an evaluation index are specified and an evaluation-index calculation unit that calculates an evaluation-index value for a data set. The evaluation index comprises an element of a first type that evaluates the sample data, an element of a second type that applies weights to the sample data, and an element of a third type that performs a statistical process on a plurality of sample data based on information outputted by the element of the first type and the element of the second type. The evaluation-index calculation unit calculates the above-mentioned evaluation-index value based on the evaluation index comprising the elements received by the input receiving unit.


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