The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Jul. 27, 2017
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Wei Cheng, Plainsboro, NJ (US);

Haifeng Chen, West Windsor, NJ (US);

Guofei Jiang, Princeton, NJ (US);

Jingchao Ni, Cleveland, OH (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/22 (2006.01); G06N 5/04 (2006.01); G06F 17/50 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 11/2257 (2013.01); G06F 17/50 (2013.01); G06N 5/048 (2013.01); G06N 20/00 (2019.01);
Abstract

A computer-implemented method for diagnosing system faults by fine-grained causal anomaly inference is presented. The computer-implemented method includes identifying functional modules impacted by causal anomalies and backtracking causal anomalies in impaired functional modules by a low-rank network diffusion model. An invariant network and a broken network are inputted into the system, the invariant network and the broken network being jointly clustered to learn a degree of broken severities of different clusters as a result of fault propagations.


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