The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2019
Filed:
Aug. 07, 2015
Applicant:
Essilor International (Compagnie Generale D'optique), Charenton-le-Pont, FR;
Inventors:
Xavier Bultez, Charenton-le-Pont, FR;
Jerome Moine, Charenton-le-Pont, FR;
Guillaume Bolteau, Charenton-le-Pont, FR;
Jean-Pierre Chauveau, Charenton-le-Pont, FR;
Assignee:
ESSILOR INTERNATIONAL, Charenton-le-Pont, FR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/404 (2006.01); G01M 11/02 (2006.01); G02C 7/02 (2006.01); G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
G05B 19/404 (2013.01); G01M 11/02 (2013.01); G01M 99/005 (2013.01); G02C 7/02 (2013.01); G05B 2219/37576 (2013.01); G05B 2219/37619 (2013.01); G05B 2219/45136 (2013.01); G05B 2219/45157 (2013.01); G05B 2219/50057 (2013.01);
Abstract
Disclosed is a method for deducing geometrical defects of an optical article turning machine, including a defect value deducing step, during which at least one geometrical defect value is deduced based at least on an indicative information of an optical and/or geometrical data related to an optical and/or geometrical characteristic of a checking piece ().