The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Apr. 18, 2017
Applicant:

Honeywell International Inc., Morris Plains, NJ (US);

Inventors:

Yanqiu Wang, Shanghai, CN;

Chengtao Zhang, Shanghai, CN;

Fei Cheng, Shanghai, CN;

Yi Cheng, Shanghai, CN;

Li Chen, Shanghai, CN;

Mei Fa Chen, Shanghai, CN;

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/042 (2006.01); G05B 19/05 (2006.01);
U.S. Cl.
CPC ...
G05B 19/0423 (2013.01); G05B 19/054 (2013.01); G05B 2219/25474 (2013.01);
Abstract

A method includes determining a scan rate associated with each of a plurality of input/output (I/O) modules. The method also includes transmitting a read request message to at least one expansion controller that controls the plurality of I/O modules, the read request message having an align index field. The method further includes receiving a reply message from the at least one expansion controller for each of the I/O modules for which a value of the align index field of the read request message is an even multiple of the associated scan rate. The method also includes incrementing the value of the align index field. In addition, the method includes repeating the transmitting, receiving, and incrementing until the value of the align index field is greater than a threshold, wherein the threshold is a least common multiple of the scan rates of the plurality of I/O modules.


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