The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2019
Filed:
Feb. 05, 2015
Lyncée Tec SA, Lausanne, CH;
Christophe Moser, Lausanne, CH;
Zahra Monemhaghdoust, Lausanne, CH;
Frédéric Montfort, Lausanne, CH;
Christian Depeursinge, Préverenges, CH;
Yves Emery, Mont-sur-Lausanne, CH;
Lyncée Tec SA, Ecublens, CH;
Abstract
The techniques, apparatus, material and systems are described for a portable camera device which can be attached to the camera port of a conventional transmission or reflection microscope for complex wave front analysis. At least one holographic element (BS, grating) splits the beam (s) containing the sample information in two beams (r,o) and filters (r', o′) them. The proposed invention has a relaxed alignment sensitivity to displacement of the beam coming from the microscope. Besides since it compensates the coherence plane tilt angle between reference and object arms, it allows for creating high-visibility interference over the entire field of view. The full-field off-axis holograms provide the whole sample information.