The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2019
Filed:
Oct. 09, 2018
Canon Kabushiki Kaisha, Tokyo, JP;
Cameron Murray Edwards, Clovelly, AU;
Eric Wai Shing Chong, Carlingford, AU;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A method for calibrating a projection system having a plurality of projectors, and a camera. The method comprises the camera capturing an image of a calibration pattern projected on to a projection surface by a first projector of the plurality of projectors; determining a projective reconstruction using corresponding points between pixels in the captured image and pixels in the projected calibration pattern; and determining a set of solutions for intrinsic parameters of the first projector, the set of solutions converting the projective reconstruction to a Euclidean reconstruction based on minimization of reprojection error between the camera and the first projector. The method also comprises determining intrinsic parameters of the first projector by selecting the intrinsic parameters from the set of solutions according to a reprojection error with respect to another projector; and applying the selected intrinsic parameters to determine a Euclidean reconstruction of the projection surface.