The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Jul. 14, 2017
Applicants:

Boe Technology Group Co., Ltd., Beijing, CN;

Beijing Boe Display Technology Co., Ltd., Beijing, CN;

Inventors:

Jie Liu, Beijing, CN;

Zheng Bian, Beijing, CN;

Jianbing Su, Beijing, CN;

Kaijie Liang, Beijing, CN;

Shuyuan Liu, Beijing, CN;

Tongbo Sun, Beijing, CN;

Siyang Chen, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/13 (2006.01); G02F 1/1333 (2006.01); G09F 9/35 (2006.01); G09G 3/00 (2006.01); H04N 17/04 (2006.01);
U.S. Cl.
CPC ...
G02F 1/1309 (2013.01); G02F 1/1333 (2013.01); G09F 9/35 (2013.01); G09G 3/006 (2013.01); H04N 17/04 (2013.01);
Abstract

The present disclosure provides a method and a device for inspecting a defect of a liquid crystal panel. The method includes steps of: performing AOI treatment on an image of the liquid crystal panel; determining a plurality of to-be-treated targets that do not meet a defect specification requirement in accordance with an AOI treatment result; ranking the plurality of to-be-treated targets in a predetermined order, and acquiring an aggregation degree parameter of every two adjacent to-be-treated targets of the ranked to-be-treated targets; comparing each aggregation degree parameter with a predetermined aggregation degree parameter to acquire a plurality of comparison results; and determining, in accordance with the plurality of comparison results, the to-be-treated targets corresponding to n consecutive aggregation degree parameters smaller than the predetermined aggregation degree parameter as aggregate-type defects of the liquid crystal panel, n being a natural number and greater than or equal to a predetermined value.


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