The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Jan. 23, 2017
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Toshihiro Aoi, Saitama, JP;

Takashi Kunugise, Saitama, JP;

Kazuyoshi Okada, Saitama, JP;

Michio Cho, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 13/00 (2006.01); G02B 7/04 (2006.01); G02B 9/64 (2006.01); G02B 13/04 (2006.01);
U.S. Cl.
CPC ...
G02B 13/0045 (2013.01); G02B 7/04 (2013.01); G02B 9/64 (2013.01); G02B 13/04 (2013.01);
Abstract

The imaging lens includes, in order from the object side, a first lens group that remains stationary during focusing; a diaphragm; and a positive second lens group that moves to the object side during focusing from a long range to a close range. The second lens group includes a positive Z lens that is formed continuously in order from a most image side, a negative Y lens that has an absolute value of a radius of curvature of an object side surface smaller than an absolute value of a radius of curvature of an image side surface, a positive X lens, and a negative W lens that has an absolute value of a radius of curvature of an image side surface smaller than that of an object side surface. The imaging lens satisfies a conditional expression about of the radii of curvature of the X lens and the W lens.


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