The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Jan. 25, 2016
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Zhaolin Chen, Eindhoven, NL;

Miha Fuderer, Eindhoven, NL;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/565 (2006.01); G01R 33/483 (2006.01); G01R 33/56 (2006.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56554 (2013.01); G01R 33/4835 (2013.01); G01R 33/56 (2013.01); G01R 33/565 (2013.01); G01R 33/5608 (2013.01); G01R 33/5611 (2013.01);
Abstract

An object () placed in an examination volume of a MR device () is subject to an imaging sequence including multi-slice RF pulses for simultaneously exciting two or more spatially separate image slices. MR signals are received in parallel via a set of RF coils () having different spatial sensitivity profiles within the examination volume. An MR image is reconstructed for each image slice from the acquired MR signals. MR signal contributions from the different image slices are separated on the basis of the spatial sensitivity profiles of the RF coils (). Side-band artifacts, namely MR signal contributions from regions excited by one or more side-bands of the multi-slice RF pulses, are suppressed in the reconstructed MR images on the basis of the spatial sensitivity profiles of the RF coils ().


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