The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Sep. 08, 2017
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Matthias Gebhardt, Erlangen, DE;

Mario Zeller, Erlangen, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/56 (2006.01); G01R 33/48 (2006.01); G01R 33/561 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5608 (2013.01); G01R 33/4818 (2013.01); G01R 33/5611 (2013.01); G01R 33/56563 (2013.01);
Abstract

In a method and magnetic resonance (MR) apparatus for avoidance of artifacts in the acquisition of MR data, first and second undersampled datasets are recorded, the measurement data of each dataset being selected such that artifacts in the first dataset exhibit a phase other than in the second dataset, and the measurement data in the first and second datasets, even when combined, correspond to undersampled dataset. The recorded, undersampled datasets are supplemented with the use of a supplementary kernel of a parallel acquisition method to form supplemented datasets from which a combined, artifact-free dataset is produced. Measurement time is thereby reduced overall compared with customary PAT averaging and compared with recording without the use of a parallel acquisition method.


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