The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2019
Filed:
Aug. 03, 2018
Applicant:
Samsung Display Co., Ltd., Yongin-si, Gyeonggi-do, KR;
Inventors:
Da Wei, Urbana, IL (US);
Mohammad Hekmat, Sunnyvale, CA (US);
Valentin Abramzon, Mountain View, CA (US);
Amir Amirkhany, Sunnyvale, CA (US);
Assignee:
Samsung Display Co., Ltd., Yongin-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 3/00 (2006.01); H03M 1/12 (2006.01); H03F 3/387 (2006.01); H03F 3/45 (2006.01); H03M 1/06 (2006.01); G01R 13/02 (2006.01);
U.S. Cl.
CPC ...
G01R 13/0272 (2013.01); H03F 3/387 (2013.01); H03F 3/45475 (2013.01); H03M 1/0663 (2013.01); H03M 1/12 (2013.01); H03M 3/46 (2013.01);
Abstract
An on-chip scope and a method for operating the on-chip scope. The on-chip scope includes a provision for operating in one of two states, the effects of voltage offsets being different in the two states. A first voltage is measured in the first state, a second voltage is measured in the second state, and the two measurements are combined to generate a voltage estimate in which the effects of voltage offsets are reduced.