The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Nov. 19, 2016
Applicant:

Hitachi High-tech Science Corporation, Tokyo, JP;

Inventors:

Hideyuki Akiyama, Tokyo, JP;

Kentaro Yamada, Tokyo, JP;

Toshitada Takeuchi, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/0016 (2013.01); G01N 35/00584 (2013.01); G01N 2035/00346 (2013.01); G01N 2035/00445 (2013.01);
Abstract

Disclosed herein are an evolved gas analyzer and a method for analyzing evolved gas, the apparatus cooling a sample holder in a short time without using excessive cooling performance and without providing the entire apparatus in an excessively large size, thereby enhancing analysis work efficiency. The apparatusincludes: a sample holderholding a sample S; a heating unitreceiving the sample holder therein, and evolving a gas component G by heating the sample; a detecting meansdetecting the gas component; a sample holder supporting unitL movably supporting the sample holder to move the sample holder to predetermined outer and inner positions of the heating unit; and a cooling unitprovided at an outside of the heating unit, and cooling the sample holder by being in direct or indirect contact with the sample holder, when the sample holder is moved to a discharging position.


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