The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Aug. 18, 2015
Applicant:

Kobe Steel, Ltd., Hyogo, JP;

Inventors:

Masakazu Kajita, Kobe, JP;

Eiji Takahashi, Kobe, JP;

Assignee:

Kobe Steel, Ltd., Hyogo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/44 (2006.01); G01M 99/00 (2011.01); G01N 29/12 (2006.01); G01N 29/46 (2006.01); G01M 13/00 (2019.01); G01M 13/045 (2019.01); G01R 31/34 (2006.01);
U.S. Cl.
CPC ...
G01N 29/4445 (2013.01); G01M 13/00 (2013.01); G01M 13/045 (2013.01); G01M 99/00 (2013.01); G01N 29/12 (2013.01); G01N 29/46 (2013.01); G01R 31/343 (2013.01);
Abstract

An abnormality detection device, an abnormality detection method and an abnormality detection system for a rotating machine according to the present invention sample a vibration of a rotating machine at a predetermined sampling frequency, output for each predetermined period of time a set of a plurality of samples detected within the predetermined period of time, store the set of samples in a storage section, perform frequency analysis on the set of samples, and display in real time frequency analysis results in chronological order. A rotating machine according to the present invention includes the abnormality detection device.


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