The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Aug. 05, 2014
Applicant:

Siemens Healthcare Diagnostics Products Gmbh, Marburg, DE;

Inventors:

Barbara Kavsek, Sankt Radegund bei Graz, AT;

Peter Lederer, Graz, AT;

Peter Taal, HK Oost-Souburg, NL;

Jan van den Boogaart, AG Someren, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); G01N 33/49 (2006.01); G01N 21/49 (2006.01); G01N 15/00 (2006.01); G01N 15/10 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1456 (2013.01); G01N 21/49 (2013.01); G01N 33/49 (2013.01); G01N 2015/0073 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/1477 (2013.01); G01N 2015/1488 (2013.01); G01N 2015/1497 (2013.01); G01N 2021/4702 (2013.01); G01N 2021/4769 (2013.01); G01N 2800/22 (2013.01); G01N 2800/26 (2013.01);
Abstract

The invention relates to an analysis method for supporting classification, a determination method for determining analysis parameters Y, E, I, σfor the analysis method, a computer program product, and an optical analysis system for supporting classification, with which system analysis parameters Y, E, I, σcan be defined on the basis of first and second calibration data. The parameters provide classification support according to the discriminant analysis and on the basis of measured values Pof optical characteristics i, in particular of organic dispersions, and the information content thereof for classification, in particular the diagnosis of disease; and permit a classification proposal or a diagnosis proposal in comparison with a threshold Y.


Find Patent Forward Citations

Kavsek, Barbara. (2019). Analysis method for supporting classification (U.S. Patent No. 10401275). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10401275

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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