The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2019
Filed:
May. 04, 2018
Boe Technology Group Co., Ltd., Beijing, CN;
Boe (Hebei) Mobile Display Technology Co., Ltd., Hebei, CN;
Yingying Liu, Beijing, CN;
Zhen Wu, Beijing, CN;
Yongjun Liao, Beijing, CN;
Xing Li, Beijing, CN;
Huijun Ma, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
BOE (HEBEI) MOBILE DISPLAY TECHNOLOGY CO., LTD., Hebel, CN;
Abstract
An optical parameter measurement device and a corresponding method are provided. A light beam from a to-be-tested display panel is split by a beam-splitting assembly into at least two testing light beams. A voltage value corresponding to a first testing light beam is measured by a trans-impedance amplification circuit corresponding to a first optical sensor. Next, an integration time period is determined by a control circuit according to voltage values from the trans-impedance amplification circuit and a predetermined relational model between voltage values corresponding to the light intensities and integration time periods. A voltage value corresponding to a second testing light beam is finely measured by the integration circuit corresponding to a second optical sensor within the integration time period. Finally, the display brightness value of the to-be-tested display panel is determined by the control circuit according to a voltage value from the integration circuit within the integration time period.