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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10401214 B1

PDFFull Text
Date of Patent:
Sep. 03, 2019

Filed:

Mar. 06, 2017

Probe, object information acquisition apparatus, and method of manufacturing the probe

Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Takahiro Akiyama, Kawasaki, JP;

Yoshio Hotta, Kamakura, JP;

Assignee:

Canon Kabushiki Kaisha, Tokyo, JP;

Attorney:

Canon U.S.A. Inc., IP Division

Primary Examiner:

Natalie Huls

Assistant Examiner:

Suman K Nath

Int. Cl.
CPC ...
G01H 9/00 (2006.01); G01N 29/24 (2006.01); A61B 5/00 (2006.01); G01N 21/17 (2006.01); A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
G01H 9/00 (2013.01); A61B 5/0095 (2013.01); A61B 8/4209 (2013.01); A61B 8/4236 (2013.01); G01N 21/1702 (2013.01); G01N 29/2406 (2013.01); G01N 29/2418 (2013.01); G01N 2021/1706 (2013.01); G01N 2291/0427 (2013.01); Y10T 156/10 (2015.01);
Abstract

A probe configured to receive an acoustic wave from an object including an element having a cell structure, in which a vibration membrane having one of a pair of electrodes formed with a gap arranged therebetween is supported so that the vibration membrane can be vibrated by the acoustic wave; a light reflection layer provided at a position near the object with respect to the element and configured to reflect light; and a support layer provided between the element and the light reflection layer and configured to support the light reflection layer.

Find Patent Forward Citations

Akiyama, Takahiro. (2019). Probe, object information acquisition apparatus, and method of manufacturing the probe (U.S. Patent No. 10401214). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10401214

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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