The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2019
Filed:
Jul. 08, 2014
University of Rochester, Rochester, NY (US);
Wayne H. Knox, Pittsford, NY (US);
Jonathan Ellis, Pittsford, NY (US);
University of Rochester, Rochester, NY (US);
Abstract
A high numerical aperture opto-mechanical scanner for writing refractive index modifications includes a fast axis scanner having a fast scanning axis. A waveform generator is electrically coupled to the fast axis scanner, and a waveform is provided by the waveform generator which defines a fast scan of the fast axis scanner. A scanning lens assembly is mechanically coupled to the fast axis scanner, the scanning lens assembly having a NA greater than 0.5 and a scanning lens motion along the fast scanning axis. A femtosecond laser is optically coupled through the scanning lens assembly to a surface of a material, creating a femtosecond laser light scanning pattern to write the refractive index modifications into the material. A method for writing refractive index modifications using a high numerical aperture opto-mechanical scanner is also described.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile