The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2019
Filed:
Oct. 03, 2014
Applicant:
Hewlett-packard Development Company, L.p., Houston, TX (US);
Inventors:
Isabel Sanz Ananos, Barcelona, ES;
Sergi Culubret, Barcelona, ES;
Santiago Sanz Ananos, Barcelona, ES;
Assignee:
Hewlett-Packard Development Company, L.P., Spring, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B29C 64/165 (2017.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B41J 25/00 (2006.01); B29C 64/386 (2017.01); B33Y 70/00 (2015.01);
U.S. Cl.
CPC ...
B29C 64/165 (2017.08); B29C 64/386 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); B41J 25/001 (2013.01); B33Y 70/00 (2014.12); G05B 2219/49023 (2013.01);
Abstract
A method of aligning an agent distributor in an apparatus for generating a three-dimensional object comprises selectively depositing an agent on a layer of build material to form a predetermined alignment pattern (), and detecting the alignment pattern () from a height profile in a surface of the build material, and performing an alignment operation using the detected alignment pattern (). An alignment pattern () may comprise, for example, a series of triangles which are scanned to determine misalignment.