The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2019
Filed:
Apr. 28, 2016
Bae Systems Plc, London, GB;
Jonathan Michael Carberry, Lancashire, GB;
Austin James Cook, Lancashire, GB;
BAE Systems plc, London, GB;
Abstract
Disclosed is a method and apparatus for determining a depth of a feature () formed in an object (), the feature () having been formed in the object () by a cutting tool (). The apparatus comprises: a camera () configured to capture an image of the feature () and a portion of the object () proximate to the feature (); and one or more processors operatively coupled to the camera () and configured to: detect, in the image, an edge () of the feature () between the feature () and a surface of the object (); using the detected edge (), calculate a diameter for a circle (); acquire a point angle of the cutting tool (); and, using the calculated diameter and the acquired point angle, calculate a depth value for the feature ().