The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Jan. 17, 2019
Applicant:

Sms Group Gmbh, Düsseldorf, DE;

Inventors:

Dirk Lieftucht, Düsseldorf, DE;

Artemy Krasilnikov, Duisburg, DE;

Felix Max Fanghänel, Dorsten, DE;

Assignee:

SMS GROUP GMBH, Düsseldorf, DE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B22D 11/20 (2006.01); B22D 11/05 (2006.01); B22D 11/22 (2006.01); B22D 11/16 (2006.01);
U.S. Cl.
CPC ...
B22D 11/202 (2013.01); B22D 11/05 (2013.01); B22D 11/168 (2013.01); B22D 11/225 (2013.01);
Abstract

A strand casting installation in which a conicity of a die is set during a casting procedure by measuring temperature values along a centric measuring path running in a casting direction along an adjustably disposed die wall; measuring temperature values along a peripheral measuring path running in a casting direction along the adjustably disposed die wall, wherein the peripheral measuring path runs between the centric measuring path and a lateral periphery of the die wall, and a spacing of the peripheral measuring path from the lateral periphery of the die wall is smaller than a spacing of the centric measuring path from the other lateral periphery of the die wall; determining a centric temperature distribution curve along the centric measuring path from the temperature values measured along the centric measuring path; determining a peripheral temperature distribution curve along the peripheral measuring path from the temperature values measured along the peripheral measuring path; determining a first area under the centric temperature distribution curve, and a second area under the peripheral temperature distribution curve; determining a difference between the second area and the first area; and setting the conicity of the die taking into account the difference.


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