The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Feb. 01, 2016
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Tsuyoshi Suzuki, Tokyo, JP;

Fuyuhiko Teramoto, Tokyo, JP;

Yuko Aoki, Tokyo, JP;

Taiga Goto, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); G06T 7/246 (2017.01); G06T 7/00 (2017.01); G06T 1/00 (2006.01); G06T 5/00 (2006.01); G06T 11/00 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/032 (2013.01); A61B 6/5205 (2013.01); G06T 1/0007 (2013.01); G06T 5/002 (2013.01); G06T 7/246 (2017.01); G06T 7/97 (2017.01); G06T 11/006 (2013.01); G06T 11/008 (2013.01); G06T 2207/10081 (2013.01);
Abstract

In order to provide an X-ray CT apparatus which can reconstruct a tomographic image with less unevenness in image quality at a high speed on the basis of projection data which is obtained by irradiating an object with X-rays, the X-ray CT apparatus of the invention includes an inverse projection phase width setting unit that sets an inverse projection phase width which is an angular width of projection data used for reconstruction, for each tomographic image, and a view weight calculation unit that calculates a view weight which is a weight coefficient multiplied by projection data within the inverse projection phase width and is a function of a view angle, for each position of a pixel of a tomographic image.


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