The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2019

Filed:

Sep. 30, 2016
Applicants:

Sebastian Bauer, Erlangen, DE;

Patrick Kugler, Erlangen, DE;

Günter Lauritsch, Nürnberg, DE;

Andreas Maier, Erlangen, DE;

Daniel Stromer, Höchstadt, DE;

Inventors:

Sebastian Bauer, Erlangen, DE;

Patrick Kugler, Erlangen, DE;

Günter Lauritsch, Nürnberg, DE;

Andreas Maier, Erlangen, DE;

Daniel Stromer, Höchstadt, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/02 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/027 (2013.01); A61B 6/032 (2013.01); A61B 6/4441 (2013.01); A61B 6/5205 (2013.01);
Abstract

A tomography system with a beam source and a detector that is adapted to carry out a scan. While the beam source is guided along a circular or helical first trajectory about an orbital axis, a rectangular sensor surface of the detector is guided at a distance from the beam source along a circular or helical second trajectory about the orbital axis. During the scan, a yaw angle between a perpendicular bisector of the sensor surface and the plane of rotation in which the beam source is currently located has a value of greater than 0° and simultaneously smaller than 90°.


Find Patent Forward Citations

Loading…