The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2019
Filed:
Jun. 16, 2015
Cellview Imaging, Inc., Toronto, CA;
Mark Hathaway, Canterbury, GB;
Rishard Weitz, Toronto, CA;
Cellview Imaging Inc., , CA;
Abstract
A method is provided for determining the thickness of a retina. A single beam is used to illuminate the retina of a patient. Interference between reflections off different layers within the retina cause autocorrelation in the returned signal. An FFT applied to the autocorrelation signal reveals the strongest autocorrelation, which indicates the distance between the nerve fiber layer (NFL) and the layers between the inner segment/outer segment (IS/OS) and the retinal pigment epithelium (RPE), the dominant scatterers. By analyzing autocorrelation, a single beam can be used. This avoids the problem of movement of the patient, arising in the use of a standard OCT interferometer, resulting in a simpler and less expensive technique of measuring retinal thickness.