The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2019
Filed:
Mar. 25, 2016
Hae-chul Lee, Gyeonggi-do, KR;
Min-goo Kim, Gyeonggi-do, KR;
In-hyoung Kim, Gyeonggi-do, KR;
Joo-hyun DO, Seoul, KR;
Hae-Chul Lee, Gyeonggi-do, KR;
Min-Goo Kim, Gyeonggi-do, KR;
In-Hyoung Kim, Gyeonggi-do, KR;
Joo-Hyun Do, Seoul, KR;
Samsung Electronics Co., Ltd, , KR;
Abstract
Apparatuses, methods, and systems of measuring received power are described, including apparatuses, methods, and systems which can measure received power, even when the subcarrier offset of the measurement bandwidth is different from the subcarrier bandwidth of the cell bandwidth. In one method, the first received power of a plurality of Resource Blocks (RBs) received from a second Base Station (BS) are measured based on first channel state information received from a first BS. Based on the determination whether a value of an index included in the first channel state information is larger than a predetermined value, at least one of second received power, third received power, and fourth received power of the plurality of RBs is measured by using second channel state information including an alternative index determined based on the first channel state information based on a result of the determination.