The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2019

Filed:

Sep. 15, 2017
Applicant:

Olympus Corporation, Hachioji-shi, Tokyo, JP;

Inventors:

Satoshi Miyazaki, Tokyo, JP;

Keiji Kunishige, Hachioji, JP;

Assignee:

Olympus Corportion, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/21 (2006.01); H04N 5/232 (2006.01); H04N 101/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/2145 (2013.01); H04N 5/23229 (2013.01); H04N 5/23293 (2013.01); H04N 2101/00 (2013.01);
Abstract

An image pickup apparatus includes a signal output section configured to output a first signal according to first operation and output a second signal according to a second operation, a first image pickup section configured to continue to receive the first signal and continuously perform image pickup of a plurality of images until receiving the second signal, a second image pickup section configured to receive the second signal and perform image pickup, an image selecting section configured to select, out of the plurality of images picked up by the first image pickup section, a desired image different from an image immediately after the reception of the second signal among images picked up by the second image pickup section, and a measuring section configured to measure a time period or a number of images from the image immediately the second signal to the desired image.


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