The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2019

Filed:

Nov. 27, 2017
Applicant:

Teledyne Lecroy, Inc., Thousand Oaks, CA (US);

Inventor:

Martin T. Miller, Mardhall, MI (US);

Assignee:

Teledyne LeCroy, Inc., Thousand Oaks, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 3/487 (2015.01); H04B 17/23 (2015.01); H04L 7/00 (2006.01); H04B 17/21 (2015.01); H04L 7/033 (2006.01);
U.S. Cl.
CPC ...
H04B 17/23 (2015.01); H04B 3/487 (2015.01); H04B 17/21 (2015.01); H04L 7/0029 (2013.01); H04L 7/0331 (2013.01);
Abstract

A method and apparatus for generating a probability density function eye are provided. The method preferably includes the steps of acquiring an input waveform, performing a clock data recovery in accordance with the input waveform to determine one or more expected transition times and defining a plurality of unit intervals of the input waveform in accordance with the one or more expected transition times. One or more values of one or more data points may then be determined in accordance with the input waveform in accordance with the one or more expected transition times, and a category for each unit interval in accordance with its state and its position within the input waveform may also be determined. One or more histograms may then be generated for the determined one or more values for each category of unit intervals.


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