The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2019

Filed:

Jun. 10, 2016
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventors:

Mitsuhiko Igarashi, Tokyo, JP;

Kan Takeuchi, Tokyo, JP;

Takeshi Okagaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03L 1/00 (2006.01); H03K 3/03 (2006.01); G11C 29/02 (2006.01); G01R 31/3185 (2006.01); G01R 31/26 (2014.01); G06F 11/34 (2006.01); H03L 7/099 (2006.01); G01R 31/27 (2006.01); H03K 3/011 (2006.01); H01L 21/822 (2006.01); H03B 1/02 (2006.01); G06F 11/07 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
H03L 1/00 (2013.01); G01R 31/2607 (2013.01); G01R 31/275 (2013.01); G01R 31/318505 (2013.01); G06F 11/008 (2013.01); G06F 11/076 (2013.01); G06F 11/3419 (2013.01); G11C 29/021 (2013.01); H01L 21/822 (2013.01); H03B 1/02 (2013.01); H03K 3/011 (2013.01); H03K 3/0315 (2013.01); H03L 7/0995 (2013.01);
Abstract

In order to provide a semiconductor device capable of detecting HCI degradation of a semiconductor element in a simple structure, the semiconductor device includes an oscillation circuit including a plurality of logic gates of various driving forces which are formed by transistors and coupled in series, a frequency counter that measures an oscillation frequency of the oscillation circuit, and a comparator that compares the oscillation frequency of the oscillation circuit measured by the frequency counter with a predetermined value.


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