The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2019

Filed:

Dec. 18, 2012
Applicant:

Quickstep Technologies Llc, Wilmington, DE (US);

Inventor:

Didier Roziere, Nimes, FR;

Assignee:

QUICKSTEP TECHNOLOGIES LLC, Wilmington, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/04 (2006.01); G01L 1/14 (2006.01); G06F 3/041 (2006.01); G06F 3/044 (2006.01); H03K 17/96 (2006.01); G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
H03K 17/9622 (2013.01); G01L 1/04 (2013.01); G01L 1/14 (2013.01); G01R 27/2605 (2013.01); G06F 3/044 (2013.01); G06F 3/0412 (2013.01); G06F 3/0414 (2013.01); G06F 3/0418 (2013.01); G06F 2203/04107 (2013.01); G06F 2203/04112 (2013.01); H03K 2017/9613 (2013.01); H03K 2217/0027 (2013.01); H03K 2217/96077 (2013.01); H03K 2217/960765 (2013.01);
Abstract

A capacitive measurement device for control interfaces, includes: (i) a support plate () having elements for attachment () to a control interface (), (ii) first electrodes () arranged on a first surface of the support plate () opposite the control interface () and including first active electrodes (), (iii) electronic capacitive measurement elements capable of enabling the obtainment of proximity and/or contact information of objects of interest (), and (iv) second electrodes () arranged on a second surface of the support plate () facing the control interface () and including second active electrodes () connected to the electronic capacitive measurement elements such as to enable the obtainment of measurements of movement and/or deformation of the support plate (). A method and apparatus implemented in the device are also described.


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