The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2019

Filed:

Oct. 30, 2017
Applicant:

Rakuten, Inc., Tokyo, JP;

Inventors:

Bjorn Stenger, Tokyo, JP;

Jiu Xu, Tokyo, JP;

Assignee:

RAKUTEN, INC., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/72 (2006.01); G06T 7/143 (2017.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/726 (2013.01); G06K 9/00476 (2013.01); G06K 9/6212 (2013.01); G06T 7/143 (2017.01); G06K 2209/01 (2013.01); G06T 2207/20084 (2013.01);
Abstract

A system for and method for improved computer vision image processing and image segmentation and recognition is disclosed. The system and method utilizes a cost function approach for improved image segmentation and recognition. In particular, a global cost function is defined and then the global cost function is minimized. This global cost function takes into account two processing pipelines of data determined by the operation of two different processing technologies upon the target input image. Constraints are utilized to ensure data consistency across the model and between the data pipelines. The system and method are useful for processing low quality images containing alphanumeric data such as floorplan images.


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