The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2019

Filed:

Jan. 25, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Shunichi Amano, Yamato, JP;

Hisashi Miyashita, Tokyo, JP;

Hideki Tai, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/263 (2006.01); G01R 31/3183 (2006.01); G06F 11/273 (2006.01);
U.S. Cl.
CPC ...
G06F 11/263 (2013.01); G01R 31/31835 (2013.01); G01R 31/318371 (2013.01); G06F 11/273 (2013.01);
Abstract

Provided is a generation device including: a test vector generation unit for selecting, for each of parameters to be included in a test vector, one value from among possible values for the parameter to generate test vectors whose combinations of values are different from each other; an extraction unit for extracting, as partial sequences each including one or more test vectors, portions of a series including the test vectors output by the test vector generation unit; and a test sequence generation unit for generating a test sequence based on the extracted partial sequences.


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