The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2019
Filed:
Aug. 15, 2017
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Thierry Supplisson, Cork, IE;
Eric Thiebaut-George, Cork, IE;
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/20 (2006.01); G06F 11/30 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0751 (2013.01); G06F 11/0787 (2013.01); G06F 11/2069 (2013.01); G06F 11/3034 (2013.01); H04L 41/069 (2013.01); H04L 41/0622 (2013.01); H05K 999/99 (2013.01);
Abstract
A method and technique for data lifecycle management includes identifying a fault from a monitored system. One or more metrics that are related to the fault are identified and stored in a memory. A lifespan condition associated with the fault is identified, and a lifespan for the one or more metrics is added or changed based on the identified lifespan condition. The one or more metrics are removed from the memory if their associated lifespans are over.