The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2019
Filed:
Dec. 11, 2015
Applicant:
Lingacom Ltd., Tel Aviv, IL;
Inventors:
Assignee:
Lingacom Ltd., Tel Aviv, IL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 9/24 (2006.01); G01T 1/26 (2006.01); G01V 5/00 (2006.01); G01V 13/00 (2006.01); H05K 3/30 (2006.01); G06T 15/00 (2011.01);
U.S. Cl.
CPC ...
G01T 1/26 (2013.01); G01N 9/24 (2013.01); G01V 5/005 (2013.01); G01V 5/0016 (2013.01); G01V 5/0025 (2013.01); G01V 5/0033 (2013.01); G01V 5/0075 (2013.01); G01V 13/00 (2013.01); G06T 15/00 (2013.01); H05K 3/30 (2013.01); H05K 3/303 (2013.01); H05K 2201/10151 (2013.01); Y02P 70/613 (2015.11);
Abstract
Methods of detecting high atomic weight materials in a volume such as a truck or cargo container are disclosed. The volume is scanned with an X-ray imaging system and a muon detection system. Using the output data of the muon detection system, the exit momentum and incoming and outgoing tracks of each muon are reconstructed. A muon scattering statistical model is calculated using the muon exit momentum and the incoming and outgoing tracks of the muon. A most likely scattering density map is determined according to the muon-scattering statistical model and an X-ray statistical model. A visual representation of the most likely scattering density map is displayed.