The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2019

Filed:

Feb. 01, 2013
Applicant:

Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);

Inventors:

Maria Altbach, Tucson, AZ (US);

Ali Bilgin, Tucson, AZ (US);

Chuan Huang, Tucson, AZ (US);

Christian Graff, Silver Spring, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/54 (2006.01); A61B 5/055 (2006.01); A61B 5/00 (2006.01); G01R 33/561 (2006.01); G06F 19/00 (2018.01); G01R 33/50 (2006.01); G01R 33/48 (2006.01);
U.S. Cl.
CPC ...
G01R 33/54 (2013.01); A61B 5/055 (2013.01); A61B 5/4244 (2013.01); G01R 33/4818 (2013.01); G01R 33/50 (2013.01); G01R 33/5611 (2013.01); G06F 19/321 (2013.01); G01R 33/5617 (2013.01); G06T 2211/436 (2013.01);
Abstract

A system and method for processing highly undersampled multi-echo spin-echo data by linearizing the slice-resolved extended phase graph model generates highly accurate Tmaps with indirect echo compensation. Principal components are used to linearize the signal model to estimate the Tdecay curves which can be fitted to the slice-resolved model for T2 estimation. In another example of image processing for highly undersampled data, a joint bi-exponential fitting process can compensate for image variations within a voxel and thus provide partial voxel compensation to produce more accurate Tmaps.


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