The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2019
Filed:
Jun. 29, 2017
Sysmex Corporation, Kobe-shi, Hyogo, JP;
Takao Fujiwara, Kobe, JP;
Kazuyoshi Horii, Kobe, JP;
Tatsuya Kosako, Kobe, JP;
Tomoyuki Nose, Kobe, JP;
Sayuri Tomoda, Kobe, JP;
SYSMEX CORPORATION, Hyogo, JP;
Abstract
Disclosed is a measurement apparatus including: a support mechanism configured to support a cartridge in which a chamber is formed, the chamber being configured to store a measurement sample that generates light an intensity of which varies depending on an amount of a test substance; a photodetector configured to detect the light generated from the measurement sample stored in the chamber; and a reflection member provided between the photodetector and the cartridge supported by the support mechanism, the reflection member having an inner face, the reflection member being configured to reflect, at the inner face, the light generated from the measurement sample stored in the chamber, and guide the light to the photodetector, wherein the reflection member is configured to have an area surrounded by the inner face, the area decreasing from a side where the cartridge supported by the support mechanism is provided toward a side where the photodetector is provided.