The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2019

Filed:

Nov. 02, 2015
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Sabine Gruber, Reifnitz, AT;

Thomas Aichinger, Villach, AT;

Stefan Krivec, Arnoldstein, AT;

Thomas Ostermann, Velden am Woerthersee, AT;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/447 (2006.01); G01N 27/453 (2006.01); G01N 27/27 (2006.01); G01N 27/414 (2006.01);
U.S. Cl.
CPC ...
G01N 27/44704 (2013.01); G01N 27/27 (2013.01); G01N 27/453 (2013.01); G01N 27/414 (2013.01);
Abstract

An apparatus for analyzing ion kinetics in a dielectric probe structure includes an ion reservoir abutting the dielectric probe structure and configured to supply mobile ions to the dielectric probe structure, a capacitor structure configured to generate an electric field in the dielectric probe structure along a vertical direction, and an electrode structure configured to generate an electrophoretic force on mobile ions in the dielectric probe structure along a lateral direction. A method for analyzing ion kinetics in the dielectric probe structure of the apparatus is also provided.


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