The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2019
Filed:
Sep. 06, 2017
Method and x-ray apparatus for generating a projective x-ray representation of an examination object
Applicant:
Siemens Healthcare Gmbh, Erlangen, DE;
Inventors:
Peter Bartl, Erlangen, DE;
Marcus Radicke, Veitsbronn, DE;
Ludwig Ritschl, Erlangen, DE;
Sven-Martin Sutter, Herzogenaurach, DE;
Assignee:
Siemens Healthcare GmbH, Erlangen, DE;
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2018.01); G01N 23/083 (2018.01); G01N 23/041 (2018.01); G21K 1/06 (2006.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01); G01N 23/041 (2018.02); G01N 23/083 (2013.01); G21K 1/067 (2013.01);
Abstract
A method and an X-ray apparatus generate a projective X-ray representation of an examination object. Two projective images obtained from a phase contrast measurement are adapted to each other in respect of their representation format and a result image is generated by combining the adapted images. The result image allows extensive separation of different structures in the examination object that is used.